Offers thin film deposition controllers and monitors and QCM measurement instruments control deposition rate and thickness of simple or complex processes with unsurpassed measurement speed and precision.
FabGuard® is designed to be the fab’s FDC system for all users and all situations. It combines both full featured data acquisition and analysis with extensive enterprise capabilities...
The INFICON helium leak detector UL3000 Fab (PLUS) is designed for the needs of leak testing in semiconductor applications. It features flexibility, mobility, fast start-up, high...
The IC6 uses INFICON ModeLock frequency measurement system to provide stable, high-resolution rate and thickness measurement with an industry-leading rate resolution of .00433...
Superior Sensitivity for Contamination Control; this RGA provides accurate and reliable data for vacuum process monitoring, process diagnostics, and leak detection in semiconductor...
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